SPS Short Course: Morphological Image Processing: Principles and Applications
Date: 13-14 June 2024
Time: 9:00AM-1:30PM ET (New York Time)
Presenter(s): Dr. Johan Debayle
Credits: 9 PDHs/ 0.9 CEUs
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Abstract
This course is an introduction to the principles and basic concepts of Mathematical Morphology (MM) with applications to digital image processing and analysis. MM is a collection of non-linear operators related to the shape of geometrical structures in an image. It familiarizes the audience with the understanding, design, and implementation of algorithms in the various sub-areas of morphological image processing such as filtering, segmentation, measurements, texture analysis, shape recognition and scene interpretation. Many relevant application examples using such morphological image processing methods (from different imaging modalities) will complement the technical descriptions.
Biography
Johan Debayle received his M.Sc., Ph.D. and Habilitation degrees in the field of image processing and analysis, in 2002, 2005 and 2012 respectively. Currently, he is a Full Professor at the Ecole Nationale Supérieure des Mines de Saint-Etienne (MINES Saint-Etienne) in France and Adjunct Professor at the University Gadjah Mada in Yogyakarta, Indonesia. He is the Deputy Director of both the SPIN Center at MINES Saint-Etienne and the LGF French Laboratory, UMR CNRS 5307. He is also the Director of the MORPHEA CNRS GDR 2021 Research Group. He is the Head of the Master of Science in Mathematical Imaging and Spatial Pattern Analysis (MISPA) at MINES Saint-Etienne.
His research interests include image processing and analysis, pattern recognition and stochastic geometry. He published more than 170 international papers in international journals and conference proceedings and he was Guest Editor of Journal Special Issues. He was invited to give a keynote/plenary talk in several international conferences (SPIE, IEEE, IAPR…).
He is the General Chair/Co-Chair of the international conferences ISIVC’2020, ICIVP’2021, ICMV’2021, ECSIA’2021, ISIVC’2022, ICPRS’2022 and served as Program committee member in several international conferences.
Dr. Debayle is Associate Editor for 7 international journals: Pattern Recognition Letters (PRL), Pattern Analysis and Applications (Springer), Journal of Electronic Imaging (SPIE), Journal of Imaging (MDPI), IET Image Processing (IET-Wiley), Springer Nature Computer Science (SN-CS) and Image Analysis and Stereology (ISSIA).
He is a Fellow of the Institution of Engineering and Technology (IET), Fellow of the International Association for Computer Science and Information Technology (IACSIT), Fellow of the International Society for Applied Computing (ISAC), Fellow of the Engineering Technology Development and Innovation Society (ETDIS) Member of the International Society for Optics and Photonics (SPIE), International Association for Pattern Recognition (IAPR) - Member of the Board of Directors of the France Section -, International Society for Stereology and Image Analysis (ISSIA) - Member of the Board of Directors -, and Senior Member of the Institute of Electrical and Electronics Engineers (IEEE). He has been appointed a Knight in the French Order of Academic Palms (Chevalier dans l'Ordre des Palmes Académiques). Visit his home page
